VIBRATION ISOLATION TECHNIQUES SUITABLE FOR PORTABLE ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (2002)
Electronic Speckle Pattern Interferometry (ESPI) and Digital Shearography are optical interference techniques, suitable for non-destructive inspection procedures. Due to the stringent vibration isolation conditions required for ESPI, the technique is mainly suited for laboratory based inspection procedures, which cannot be said for Digital Shearography. On the other hand, the interference patterns obtained using ESPI exhibit better fringe definition and contrast than those obtained using Digital Shearography. The image quality of Digital Shearography can be improved by introducing phase stepping and unwrapping techniques, but these methods add a level of complexity to the inspection system and reduce the image refresh rate of the overall process.
As part of a project to produce a low cost portable ESPI system suitable for industrial applications, this paper investigates various methods of minimizing the impact of environmental vibration on the ESPI technique. This can be achieved by effectively freezing the object movement during the image acquisition process. The methods employed include using a high-powered infra-red laser, which is continuously pulsed using an electronic signal generator as well as a mechanical chopper. The effect of using a variable shutter speed camera in conjunction with custom written software acquisition routines is also studied.
The techniques employed are described and are applied to selected samples. The initial results are presented and analysed. Conclusions are drawn and their impact on the feasibility of a portable ESPI system discussed.Complete Paper (1768kB)